Erhardt+Leimer will introduce new web guiding and inspection technology at Labelexpo including an ELCAM Pattern Guiding System for ‘cut-to-mark’ applications.
The Erhardt+Leimer ELCAM Pattern Guiding System allows the operator to control the position of labels during the slitting process.
In many applications, it is essential the position of the print is exactly referenced to the slit position to avoid problems in applying the label to the final product.
In addition, the system can simultaneously measure and control the position of the printed image in relation to the die. The system can be integrated very easily into any digital E+L web guiding system and so permits accurate positioning during different stages of the production.
Erhardt+Leimer will also display the ELCAM Matrix and Missing Label Detection (MMLD) system, designed to replace conventional arrays of ultrasonic or optical sensors. After a teach-in process, which only takes a few seconds, the camera reliably detects any missing label or unremoved matrix, said the company.
When a defect is detected, a message is sent via a digital interface to the machine controller, which stops the web in exactly the right position on the splicing table.
E+L’s real time editing (RTE) workflow solution for the NYSCAN 100% print inspection system involves editing inspection results in real time on the printing press to achieve production-optimised finishing.
A camera-based varnish detection system will also be showcased for detecting defects in the transparent coat of varnish applied to labels after the printing process.